MOSFET, IGBT or SiC: Which Switch to Choose
A decision guide by voltage, current and frequency, with the crossover points where each technology wins and the losses that decide them.
OCENME Engineering · Published November 12, 2026 · 5 min read
Choose silicon MOSFETs below 200 V, IGBTs above 400 A or below 20 kHz at high voltage, and silicon carbide between 600 V and 1200 V when switching frequency exceeds roughly 30 kHz. The decision is a loss comparison at your actual voltage, current and frequency — not a technology preference.
Key points
- Below 200 V, silicon MOSFETs win on every axis including cost
- IGBT tail current makes it lose above about 20 kHz; conduction loss makes it win above 400 A
- SiC beats super junction silicon at 650 V above roughly 30 kHz, not at 65 kHz and 100 W
- The crossover is a loss calculation, and it moves with cooling, cost of magnetics and EMI effort
The three-way trade-off in one table
| Property | Silicon MOSFET | IGBT | SiC MOSFET |
|---|---|---|---|
| Voltage range | 30–900 V | 600–6500 V | 650–1700 V |
| Current range | up to ~200 A per device | 10–3600 A | 10–100 A per device |
| Conduction behaviour | resistive (I²R) | fixed forward drop + resistive part | resistive, lower per area than silicon |
| Switching frequency | up to ~500 kHz at low voltage | 2–20 kHz typical | 30–200 kHz realistic |
| Tail current | none | yes, dominates turn-off loss | none |
| Body diode recovery | present, low Qrr in modern parts | present in the anti-parallel diode | low but not zero |
| Gate drive | 10 V (4.5 V logic-level) | 15 V, often bipolar | 15–18 V, negative off-bias recommended |
| Ruggedness | high, avalanche rated | very high, short-circuit rated | lower short-circuit withstand time |
| Relative cost per amp | lowest below 200 V | lowest above 400 A | highest, falling |
Read the table as a set of boundaries rather than a ranking. Each technology is the best answer inside a region, and the regions overlap at their edges — which is where the arguments happen.
The conduction argument
At high current, conduction loss decides. A MOSFET dissipates I² × RDS(on); an IGBT dissipates VCE(sat) × I plus a small resistive term.
Take 600 V, 200 A. A silicon super junction MOSFET rated for that current would need a very large die and several devices in parallel; the IGBT does it with a 1.7 V forward drop, dissipating 340 W at 200 A, which is manageable with a proper heatsink. A single SiC MOSFET at 200 A is possible but expensive.
Now take 600 V, 20 A. The IGBT still drops 1.7 V and dissipates 34 W. A 650 V super junction MOSFET at 190 mΩ dissipates 76 W at 20 A — worse. But at 50% duty with a freewheeling path the average conduction is lower, and once switching loss is added at 65 kHz, the IGBT’s tail current makes it lose badly. This is why 20 A offline power supplies moved from IGBT to super junction silicon, and then to SiC as frequency rose.
The switching argument
The IGBT’s weakness is tail current: after the gate is off, stored charge in the drift region must recombine, and the collector current decays over a microsecond or more. At 20 kHz that is tolerable; at 100 kHz it is the dominant loss.
SiC’s advantage is that it has no tail current and its output charge is small, so it can switch in tens of nanoseconds. The price is electromagnetic: dv/dt of 50 V/ns turns every parasitic capacitance in the layout into a current source, and every nanohenry of common-source inductance into a gate voltage error.
SiC also changes the magnetics economics. Doubling frequency halves the transformer core, and at 30–100 kHz that saving often pays for the more expensive devices. In a 3 kW telecom rectifier, the inductor and heatsink savings frequently exceed the device cost delta.
The frequency crossover, roughly
| Bus voltage | Frequency | Practical choice | Reason |
|---|---|---|---|
| 48 V | 100–500 kHz | Silicon trench or SGT | Conduction dominates, SiC offers nothing |
| 400 V | 20–65 kHz | Super junction silicon | Switching loss still small, cost lowest |
| 400 V | 65–200 kHz | SiC MOSFET | Tail-free switching, smaller magnetics |
| 800 V | any | SiC | Silicon 800 V parts lose on RDS(on) per area |
| 400 V, 400 A | 2–10 kHz | IGBT | Conduction dominates, cost per amp lowest |
| 400 V, 400 A | 20 kHz+ | IGBT or SiC module | Depends on thermal budget; both are used |
The numbers are starting points, not rules. A design with excellent cooling can justify silicon where the table says SiC, and a sealed enclosure with no airflow can justify SiC where the table says silicon — because efficiency buys thermal headroom, and thermal headroom buys reliability.
What usually decides it in practice
Three factors override the loss calculation more often than engineers expect.
Cooling cost. A 1.5% efficiency gain in a 3 kW unit is 45 W less heat. If that removes a fan, the saving is not just the fan — it is the acoustic specification, the dust filter, the service interval and the warranty exposure. SiC often pays for itself this way rather than through the device price.
EMI effort. SiC’s fast edges make conducted emissions worse, and fixing that costs filter components and board area. A design that switches at 65 kHz with silicon and passes CISPR 32 on the first attempt may be cheaper overall than a 200 kHz SiC design that needs two rounds of filter work.
Supply risk. SiC die come from a small number of foundries, and lead times move. For a product with a ten-year life, the second-source question is harder with SiC than with silicon. That is a commercial fact, not a technical one, and it belongs in the decision.
Where each technology is simply wrong
A silicon MOSFET above 900 V is possible and rarely sensible: the drift region becomes so resistive that the die is large, expensive and thermally awkward. An IGBT at 300 kHz is possible and always wrong: the tail current turns the device into a heater. A SiC MOSFET driven from a 10 V silicon gate driver will fail at turn-off, and the failure will be blamed on the device rather than the drive.
If your design sits near a boundary, describe the circuit — bus voltage, current waveform, frequency, cooling and the EMI standard you must pass — and ask for a loss comparison rather than a recommendation. We publish the device data for silicon MOSFETs and SiC MOSFETs on separate pages precisely so the comparison can be made on numbers; the glossary explains FOM, Qrr and Eoss with the practical consequence of each.
This article describes general manufacturing practice for machined and fabricated components. It is not a substitute for a drawing-specific engineering review — tolerances, material selection and process capability depend on the individual part.